[1] Peng Zhang, Yun Guo, Keyang Cao, Mingdong Yi, Liya Huang, Wei Shi, Jintao Zhu, and Wei Huang, The Effect of Shallow Trap Density on the Electrical Characteristics of an Organic Nonvolatile Memory Device Based on Eight-Hydroxyquinoline,IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 68, NO. 3, MARCH 2021:1235-1241.
[2] Peng Zhang, Emmanuel Jacques, Régis Rogel, Laurent Pichon, and Olivier Bonnaud, Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 69, NO. 6, JUNE 2022:3175-3180.
[3] Peng Zhang, Emmanuel Jacques, Régis Rogel, Laurent Pichon, and Olivier Bonnaud, Interpretation of Hopping Transport Based on Pentacene Thin-Film Transistors, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 70, NO. 12, DECEMBER 2023: 6364-6368.
张鹏,汉族,1983年5月出生,江苏南京人,本科苏州大学光信息科学与技术专业,硕士东南大学光学工程专业,博士法国雷恩第一大学微电子学专业,2013年6月入职于bv1946伟德官网,现工作于伟德源自英国始于1946。
主要研究领域为有机和无机薄膜晶体管,及基于有机薄膜晶体管的非易失性存储器等相关领域。